Dynamic voltage-level clock tuning

ABSTRACT

Apparatus and methods are provided for improving yield and frequency performance of integrated circuit processors, such as multiple-core processors. In an example, an apparatus can include a plurality of clock buffers, each clock buffer of the plurality of clock buffers configured to receive a first clock signal and distribute a plurality of second clock signals, a one-time programmable locate critical path mechanism configured provide a plurality of indications to enable or disable a delay of each clock buffer of the plurality of clock buffers, and a power management control circuit configured to over-ride one or more of the plurality of indications in a first non-test mode of operation of the apparatus and to not over-ride the one or more indications in a second non-test mode of operation of the apparatus.

TECHNICAL FIELD

The disclosure herein relates generally to integrated processors andmore particularly to speed improvements to compensate for smallstructural differences of otherwise identical semiconductor devices.

BACKGROUND

As semiconductor electronics have evolved, increasing speed, reducingsize, and conserving power have become some of the busiest areas ofdevelopmental focus. Incremental innovation, in each area, can holdpromise of capturing, at least for a while, marketplace advantage overcompetitors. Multi-core processors can rely on synchronization ofsequential logic circuits to provide top-end processing speed. Testingand calibration can make use of distributed clock delays to compensatefor micro-structural manufacturing differences between otherwiseidentical devices that limit top-end speed synchronization. However,using the delays to achieve top-end optimization can reduce the yield ofcores. In certain situations, although the added delays improve highfrequency performance, the added delays can prohibit acceptableoperation during low-speed/low voltage operation.

BRIEF DESCRIPTION OF THE DRAWINGS

In the drawings, which are not necessarily drawn to scale, like numeralsmay describe similar components in different views. Like numerals havingdifferent letter suffixes may represent different instances of similarcomponents. Some embodiments are illustrated by way of example, and notlimitation, in the figures of the accompanying drawings in which:

FIG. 1 illustrates generally a block diagram of an example core of anintegrated circuit processor.

FIG. 2 illustrates generally voltage and frequency signal plots of anexample core with an improved clock distribution mechanism that canimprove performance and yield of cores over conventional LCP and FLCPtechniques without reprocessing the cores when frequency limiters areidentified.

FIG. 3 illustrates generally a flowchart of an example method 300 ofoperating a processor or a core using an example power managementcontrol circuit.

FIG. 4 illustrates a block diagram of an example machine 400 upon whichany one or more of the techniques (e.g., methodologies) discussed hereinmay perform.

DETAILED DESCRIPTION

The following description and the drawings sufficiently illustratespecific embodiments to enable those skilled in the art to practicethem. Other embodiments may incorporate structural, logical, electrical,process, and other changes. Portions and features of some embodimentsmay be included in, or substituted for, those of other embodiments.Embodiments set forth in the claims encompass all available equivalentsof those claims.

Each wafer of processor silicon units that returns from manufacturing orfabrication goes through a sorting and classification process ormechanism and also through quality checks (QNR) before being sent tocomponent debug (CD) for timing analysis. During the sorting mechanism,damaged units can be being filtered out and the remaining units aredistributed to different groups according to the nature of their siliconcharacteristics (e.g., fast/slow material, more/less leaky material,etc.). Component debug (CD) can be responsible for detecting the worsetiming paths, detecting root cause of such timing paths andcommunicating such findings to the design team to implement fixes in thenext design step/dash. A conventional mechanism to investigate the rootcause for timing limiters (e.g. worst timing paths which limit themaximal operative frequency of the CPU) is a located critical paths(LCP) mechanism. The timing paths in synchronic design can includesequential elements which sample data and synchronize data. The natureof the timing path is primarily guided by the interaction between onesequential element that generates or passes data to another sequentialelement that receives or samples the data. The concept of a fused locatecritical path (FLCP) mechanism is based on the idea that by delaying theclocks of the sampling elements, the worse timing paths between thesampling elements can be revealed. For example, delaying the clock of agenerating element can lead to frequency drop, while delaying the clockof a sampling element can lead to frequency improvement. Delaying theclocks one by one can reveal both generating and sampling elements ofthe frequency limiter and can hint at the possible root cause of afrequency limitation. Core design can include many clock elements whichare called regional clock buffers (RCBs). RCBs can enable themanipulation of a clock network delay in component debug. The output ofan RCB can be the functional clock of multiple sequential elements. RCBinputs can include the functional clock from the Spine/PLL of the coreand, optionally, control signals driven by an LCP mechanism. The controlsignals can command the RCB to apply a clock delay on a particular edge(rise or fall) of the clock signal. Each sequential element can becontrolled by a clock network which starts with one of the RCB elements,thus can be later manipulated by the LCP mechanism. Traditional LCPmechanisms are only available for testability in CD, thus, once a rootcause is identified, the cores need to be reprocessed. FLCP mechanismrepresent an improvement tp convention LCP mechanism. Contrary totraditional LCP mechanisms, the the FLCP can fix the clock manipulationon sampling elements for functional or non-testing operation. FLCPmechanisms can lead to frequency improvement of cores in production.FLCP mechanisms are aimed to be used during the production release stepin order to solve big frequency outliers, however, FLCP may also be usedbetween steps in order to help with the debug process.

However, although FLCP can reduce reprocessing and increase initialyields, FLCP can also introduce min delay issues. Such minimum delayissues can include a scenario in which data from the next cycle ismistakenly sampled in the current cycle due to a FLCP delayed clock. Asexplained before, each LCP controller practically delays multiple clockswhich are connected to multiple sequential elements, thus although itimproves frequency for the limiter path, it can also increases thechance for minimum delay problems on other paths. Minimum delay problemis reflected in yield impact as well as minimum supply poser increase.In low voltage levels, the minimum delay impact can be greater and canbe compensated for by operating the core at a higher minimum voltage,which can have an undesired or negative impact on the power requirementof the CPU

FIG. 1 illustrates generally a block diagram of an example core 100 ofan integrated circuit processor. In certain examples, the core 100 caninclude an improved clock distribution techniques that allow forimproved performance and fabrication yield over prior clock distributiontechniques. In certain examples, the core 100 can include one or morefunctional unit blocks (FUBs) 102, 103, 104, and an example powermanagement control circuit 105. The power management control circuit 105can receive voltage and frequency information from the core, as well as,voltage and frequency information for the FUBs 102, 103, 104, and caninfluence delay settings associated with clock distribution networks 106of each FUB.

A functional unit block (FUB) 102, 103, 104 can be designed to perform aparticular processing task. Such functional unit blocks 102, 103, 104can include, but are not limited to, an individual adder, a decoder, acache, etc. In certain examples, a FUB 102 can include a locate criticalpath (LCP) controller 107, one or more regional clock buffers (RCBs)108, and a plurality of sequential logic circuits 109, or sequentiallogic circuit devices, configured to receive an output of at least oneof the RCBs 108. Within the FUB 102, sequential logic circuits 109 canwork in parallel to generate and sample data. Synchronization of suchfunctions allows the FUBs 102, 103, 104 to work together within the core100.

As discussed above, the LCP controller 107 can be activated during wafertesting. In certain examples, the LCP controller 107 is activated whenthe core 100 is being sorted into performance classes. The LCPcontroller 107 can assist in locating frequency limiting paths of theFUBs 102, 103, 104 and can assist in configuring clock delays incooperation with the regional clock buffers (RCBs) 108 to identity highfrequency limits and ultimately improve high frequency performance ofthe FUBs 102, 103, 104 and the core 100.

RCBs 108 can allow manipulation on the clock network 106. An output ofan RCB 108 can be the functional clock of multiple sequential elements109 of a FUB 102. Each RCB 108 can receive a clock signal (CLK) from aspine or phase-locked loop (PLL) of the core 100. In certain examples,an RCB 108 can also receive control signals from the LCP controller 107that can command that a delay be applied to either a rising edge of theRCB output or the trailing edge of the RCB output. In certain examples,a clock buffer, such as a regional clock buffer, can include one or morelogical gates such as, but not limited to, an AND gate, an OR gate, orcombinations thereof. In certain examples, enabling or disabling one ormore of the logical gates can provide a desired delay to improve highfrequency performance of at least a portion of the sequential logiccircuits 109

In certain examples, an RCB 108 can receive a clock signal (CLK) of thecore 100, and can re-distribute the clock signal to one or moresequential logic circuits 109 of the FUB 102. Each sequential logiccircuit 109 can be controlled by a clock distribution network 106 whichstarts with one of the RCB elements 108, thus, can be manipulated,during testing of the core 100, by the LCP mechanism. During classsorting of the cores 100, the LCP controllers 107 can test and setdelays of the RCBs 108 to optimize frequency-type performance of the FUB102, 103, 104 locally and of the core 100 in general. Once the delaysare set, the LCP controllers 107 can be disabled and the RCB delays canbecome fixed when the LCP controller 109 is implemented with a FLCPmechanism. The sequential logic circuits 109 can receive a clock signalfrom an RCB 108 and can perform the tasks required of the FUB 102.Although the sequential logic circuits 109 have been optimized toprovide the best high-frequency performance via the delays introducedwith the LCP controller 107, those delays can render some sequentiallogic circuits 109 unfit for use because the delays do not allow thecore 100 to function robustly within low-frequency performancerequirements.

In certain examples, the FUB 102 can include a delay controller circuit110 and the delay controller circuit 110 can receive power managementinformation from the power management control circuit 105 of the core100. The delay controller circuit 110 can use the power managementinformation to alter or interrupt the delay settings fixed by the LCPcontroller 107 for one or more RCBs 108 of the FUB 102. Such animprovement can allow certain clock domains, such as ones that usedclock delays to improve high frequency operation, to eliminate the clockdelays such that low frequency operation can meet desired performancethresholds, also.

FIG. 2 illustrates generally voltage and frequency signal plots 201, 202of an example core with an improved clock distribution mechanism thatcan improve performance and yield of cores over conventional LCP andFLCP techniques without reprocessing the cores when frequency limitersare identified. In certain examples, multi-core processors are capableof adjusting operating conditions, or power flows of the cores.Likewise, the cores can include a power management control circuit tocontrol transitions of the core and the FUBs between power flows. Incertain examples, the power management control circuit can create a safezone 203, 204 for transitioning or over-riding the delays set by the LCPcontroller or the FLCP controller. Such safe zones can be characterizedby high supply voltage and low operating frequency of the FUB. In suchsafe zones of operation, if the LCP delays are disabled, any speedlimiting paths will not be exposed because the frequency is lower than afrequency threshold (f_(T)) that can be significantly lower than aknown, robust, maximum operating frequency. In addition, if the LCPdelays are enabled, low-speed minimum supply voltage issues will not beexposed because the power management control circuit can command thatthe supply voltage be maintained above a voltage threshold (V_(T)).Referring again to FIG. 2, the signal plots 201, 202 illustrate a coreor a FUB transitioning from a high performance mode of operation 210 toa lower performance mode of operation 211 and then transitioning back tothe high performance mode of operation 212. Prior to the transition fromthe high performance mode of operation 210 to the lower performance modeof operation 211, the supply voltage an be at a first voltage level (V₁)above the voltage threshold (V_(T)) and the clock frequency can be at afirst frequency (f₁). In certain examples, the first frequency (f₁) canbe a maximum operating frequency of the core. In addition, since theoperating frequency of the core is at a high frequency, the delays fixedby the LCP or by the FLCP controller can be enabled to compensate forany frequency limiter paths within the sequential logic. During thetransition from the high performance mode of operation 210 to the lowerperformance mode of operation 211, the power management controller cancommand that the supply voltage to the core or the FUB be at the firstvoltage level (V₁) above the voltage threshold (V_(T)) and that theoperating frequency be reduced from the first frequency (f₁) to a secondfrequency (f₁). In certain examples, the frequency of the core can becommanded to a minimum operating frequency to conserve power. Once thefrequency has lowered below the frequency threshold (f_(T)) and during asubsequent safe zone period 215 in which operating frequency remainsbelow the frequency threshold (f_(T)) and the voltage remains above thevoltage threshold (V_(T)), the power management system can command thatthe LCP initiated delays or the FLCP delays be over-rode or disabled. Incertain examples, an output of the power management control circuit cantrigger a gate coupled to one or more of the RCBs to disable one or moreof the LCP or FLCP delays. After the power management control circuitcommands that the LCP delays be over-rode, the power management controlcircuit can command that the supply voltage to the core be lowered to asecond voltage level (V₀) to further conserve power while the core isoperated in a lower performance mode of operation 211. In some examples,a lower performance mode of operation can be a sleep mode of one or moreof the cores.

During the transition from the low performance mode of operation 211 toa higher performance mode of operation 212, the clock frequency to thecore or the FUB can be commanded by the power management controller tobe at a level below the frequency threshold (f_(T)) and the supplyvoltage to the core can be commanded to be raised beyond the voltagethreshold (V_(T)). In certain examples, the supply voltage of the corecan be commanded to a level that will not expose any minimum supplyvoltage issues when the LCP delays are enabled at a low clock frequency.Once the voltage has risen above the voltage threshold (V_(T)) andduring a subsequent safe zone period 215 in which operating frequencyremains below the frequency threshold (f₁), the power management systemcan command that the LCP initiated delays or the FLCP delays be enabled.In certain examples, an output of the power management control circuitcan trigger a gate coupled to one or more of the RCBs to enable the LCPdelays. After the power management control circuit commands that the LCPdelays be enabled, the power management control circuit can command thatthe clock frequency to the core be raised to allow the core to providehigh performance operations in a high performance mode of operation 212.

In certain examples, use of a power management controller to interruptthe typically fixed high-frequency delay compensation configured withthe use of an LCP controller, or an FLCP controller, can allow forhigher yields of core circuits that can provide robust performance atboth high frequency and low frequency thresholds, where at least one ofthose performance levels would not have been possible using atraditional LCP controller, where the LCP controller or the output ofthe LCP controller is not adjustable during non-test operation of thecore.

FIG. 3 illustrates generally a flowchart of an example method 300 ofoperating a processor or a core using an example power managementcontrol circuit. At 301, a clock delay can be enabled at regional clockbuffer of a core or of a functional unit block of the core in a firstpower flow, or non-test operating mode of the processor. The first powerflow can be characterized by a first supply voltage of the sequentiallogic circuits of the functional unit block and by a first clockfrequency of the functional unit block. In certain examples, a powermanagement controller of the core can control the supply voltage leveland the target clock frequency. At 303, the sequential logic circuitscan be operated in a high power flow or high performance non-test modeof operation using a supply voltage at a first supply voltage and anoperating frequency at a first clock frequency.

At 305, the operating frequency of the sequential logic circuits of thefunctional unit block can be commanded to be reduced in anticipation oftransitioning to a lower power flow or lower performance operating modeof the core. In certain examples the operating frequency, or clockfrequency, can be reduced to a second clock frequency. In certainexamples, the power management controller of the core can command thereduction in the operating frequency.

At 307, a clock delay associated with a clock signal that drives thesequential logic circuits can be disabled. In certain examples, theclock delay was configured during testing to compensate a frequencylimiting data path. In certain examples, a locate critical path (LCP)controller of the core was used to identify the frequency limiting datapath. In some examples, a fused locate critical path (FLCP) mechanismwas used during testing to fix the delay for post-production or non-testoperation. At 305, a power management controller can interrupt orover-ride the fixed delay command to disable the delay, for example, bydisabling a delay element of a regional clock buffer of the functionalunit block. Disabling the delay can reduce the upper operating speed ofthe sequential logic circuits, however, since the power managementcontroller has reduced the operating frequency prior to disabling thedelay, there is little if any risk of operating the sequential logic toofast.

At 309, the sequential logic circuits can be operated in a lowperformance or low-power mode using the reduced frequency and a reducedsupply voltage. In certain examples, the low power flow can represent asleep mode of operation of the core.

FIG. 4 illustrates a block diagram of an example machine 400 upon whichany one or more of the techniques (e.g., methodologies) discussed hereinmay perform. In alternative embodiments, the machine 400 may operate asa standalone device or may be connected (e.g., networked) to othermachines. In a networked deployment, the machine 400 may operate in thecapacity of a server machine, a client machine, or both in server-clientnetwork environments. In an example, the machine 400 may act as a peermachine in peer-to-peer (or other distributed) network environment. Asused herein, peer-to-peer refers to a data link directly between twodevices (e.g., it is not a hub- and spoke topology). Accordingly,peer-to-peer networking is networking to a set of machines usingpeer-to-peer data links. The machine 400 may be a personal computer(PC), a tablet PC, a set-top box (STB), a personal digital assistant(PDA), a mobile telephone, a web appliance, a network router, switch orbridge, or any machine capable of executing instructions (sequential orotherwise) that specify actions to be taken by that machine. Further,while only a single machine is illustrated, the term “machine” shallalso be taken to include any collection of machines that individually orjointly execute a set (or multiple sets) of instructions to perform anyone or more of the methodologies discussed herein, such as cloudcomputing, software as a service (SaaS), other computer clusterconfigurations.

Examples, as described herein, may include, or may operate by, logic ora number of components, or mechanisms. Circuit sets are a collection ofcircuits implemented in tangible entities that include hardware (e.g.,simple circuits, gates, logic, etc.). Circuit set membership may beflexible over time and underlying hardware variability. Circuit setsinclude members that may, alone or in combination, perform specifiedoperations when operating. In an example, hardware of the circuit setmay be immutably designed to carry out a specific operation (e.g.,hardwired). In an example, the hardware of the circuit set may includevariably connected physical components (e.g., execution units,transistors, simple circuits, etc.) including a computer readable mediumphysically modified (e.g., magnetically, electrically, moveableplacement of invariant massed particles, etc.) to encode instructions ofthe specific operation. In connecting the physical components, theunderlying electrical properties of a hardware constituent are changed,for example, from an insulator to a conductor or vice versa. Theinstructions enable embedded hardware (e.g., the execution units or aloading mechanism) to create members of the circuit set in hardware viathe variable connections to carry out portions of the specific operationwhen in operation. Accordingly, the computer readable medium iscommunicatively coupled to the other components of the circuit setmember when the device is operating. In an example, any of the physicalcomponents may be used in more than one member of more than one circuitset. For example, under operation, execution units may be used in afirst circuit of a first circuit set at one point in time and reused bya second circuit in the first circuit set, or by a third circuit in asecond circuit set at a different time.

Machine (e.g., computer system) 400 may include a hardware processor 402(e.g., a central processing unit (CPU), a graphics processing unit(GPU), a hardware processor core, a multiple-core processor, or anycombination thereof), a main memory 404 and a static memory 406, some orall of which may communicate with each other via an interlink (e.g.,bus) 408. The machine 400 may further include a display unit 410, analphanumeric input device 412 (e.g., a keyboard), and a user interface(UI) navigation device 414 (e.g., a mouse). In an example, the displayunit 410, input device 412 and UI navigation device 414 may be a touchscreen display. The machine 400 may additionally include a storagedevice (e.g., drive unit) 416, a signal generation device 418 (e.g., aspeaker), a network interface device 420, and one or more sensors 421,such as a global positioning system (GPS) sensor, compass,accelerometer, or other sensor. The machine 400 may include an outputcontroller 428, such as a serial (e.g., universal serial bus (USB),parallel, or other wired or wireless (e.g., infrared (IR), near fieldcommunication (NFC), etc.) connection to communicate or control one ormore peripheral devices (e.g., a printer, card reader, etc.).

The storage device 416 may include a machine readable medium 422 onwhich is stored one or more sets of data structures or instructions 424(e.g., software) embodying or utilized by any one or more of thetechniques or functions described herein.

The instructions 424 may also reside, completely or at least partially,within the main memory 404, within static memory 406, or within thehardware processor 402 during execution thereof by the machine 400. Inan example, one or any combination of the hardware processor 402, themain memory 404, the static memory 406, or the storage device 416 mayconstitute machine readable media.

While the machine readable medium 422 is illustrated as a single medium,the term “machine readable medium” may include a single medium ormultiple media (e.g., a centralized or distributed database, and/orassociated caches and servers) configured to store the one or moreinstructions 424.

The term “machine readable medium” may include any medium that iscapable of storing, encoding, or carrying instructions for execution bythe machine 400 and that cause the machine 400 to perform any one ormore of the techniques of the present disclosure, or that is capable ofstoring, encoding or carrying data structures used by or associated withsuch instructions. Non-limiting machine readable medium examples mayinclude solid-state memories, and optical and magnetic media. In anexample, a massed machine readable medium comprises a machine readablemedium with a plurality of particles having invariant (e.g., rest) mass.Accordingly, massed machine-readable media are not transitorypropagating signals. Specific examples of massed machine readable mediamay include: non-volatile memory, such as semiconductor memory devices(e.g., Electrically Programmable Read-Only Memory (EPROM), ElectricallyErasable Programmable Read-Only Memory (EEPROM)) and flash memorydevices; magnetic disks, such as internal hard disks and removabledisks; magneto-optical disks; and CD-ROM and DVD-ROM disks.

The instructions 424 may further be transmitted or received over acommunications network 426 using a transmission medium via the networkinterface device 420 utilizing any one of a number of transfer protocols(e.g., frame relay, internet protocol (IP), transmission controlprotocol (TCP), user datagram protocol (UDP), hypertext transferprotocol (HTTP), etc.). Example communication networks may include alocal area network (LAN), a wide area network (WAN), a packet datanetwork (e.g., the Internet), mobile telephone networks (e.g., cellularnetworks). Plain Old Telephone (POTS) networks, and wireless datanetworks (e.g., Institute of Electrical and Electronics Engineers (IEEE)802.11 family of standards known as Wi-Fi®. IEEE 802.16 family ofstandards known as WiMax®). IEEE 802.15.4 family of standards,peer-to-peer networks, among others. In an example, the networkinterface device 420 may include one or more physical jacks (e.g.,Ethernet, coaxial, or phone jacks) or one or more antennas to connect tothe communications network 426. In an example, the network interfacedevice 420 may include a plurality of antennas to wirelessly communicateusing at least one of single-input multiple-output (SIMO),multiple-input multiple-output (MIMO), or multiple-input single-output(MISO) techniques. The term “transmission medium” shall be taken toinclude any intangible medium that is capable of storing, encoding orcarrying instructions for execution by the machine 400, and includesdigital or analog communications signals or other intangible medium tofacilitate communication of such software.

Additional Examples and Notes

In Example 1, an apparatus can include a plurality of clock buffers,each clock buffer of the plurality of clock buffers configured toreceive a first clock signal and distribute a plurality of second clocksignals, a one-time programmable locate critical path mechanismconfigured provide a plurality of indications to enable or disable afirst delay of each clock buffer of the plurality of clock buffers, anda power management control circuit configured to over-ride one or moreof the plurality of indications in a first non-test mode of operation ofthe apparatus and to not over-ride the one or more indications in asecond non-test mode of operation of the apparatus.

In Example 2, the one-time programmable locate critical path mechanismof Example 1 optionally is programmed during a test mode of theapparatus.

In Example 3, the first non-test mode of any one or more of Examples 1-2optionally is defined by a first supply voltage of the apparatus and afirst frequency of the first clock signal, and the second non-test modeof any one or more of Examples 1-2 optionally is defined by a secondsupply voltage of the apparatus and a second frequency of the firstclock signal.

In Example 4, the apparatus of any one or more of Examples 1-3optionally includes a plurality of delay controller circuits, each delaycontrol circuit configured to receive one indication of the plurality ofindications and an output of the power management control circuit, andto control one or more delay elements of the plurality of clock buffersbased on the one indication and the output of the power managementcontrol circuit.

In Example 5, the power management control circuit of any one or more ofExamples 1-4 optionally is configured to receive a representation of thesupply voltage of the apparatus and a representation of the frequency ofthe first clock signal, and to provide control information to theplurality of delay controller circuits as the output of the powermanagement control circuit.

In Example 6, the power management control circuit of any one or more ofExamples 1-5 optionally includes a first voltage threshold and a firstfrequency threshold.

In Example 7, during a transition from the first mode to the secondmode, the apparatus of any one or more of Examples 1-6 optionally isconfigured to transition an operating frequency of the apparatus, afirst transition of the operating frequency, from the first frequency tothe second frequency before transitioning a supply voltage of theapparatus, a first transition of the supply voltage, from the firstsupply voltage to the second supply voltage, wherein the first frequencyis higher than the second frequency. In Example 8, the power managementcontrol circuit of any one or more of Examples 1-7 optionally isconfigured to detect the first transition of the operating frequency,and to provide first command information to the one or more delayelements before the first transition of the supply voltage.

In Example 9, the one or more delay elements of any one or more ofExamples 1-8 optionally are configured to provide a second delay inresponse to the first command information.

In Example 10, the second delay of any one or more of Examples 1-9optionally is equivalent to bypassing the one or more delay elements.

In Example 11, during a transition from the second mode to the firstmode, the apparatus of any one or more of Examples 1-10 optionally isconfigured to transition a supply voltage of the apparatus, a secondtransition of the supply voltage, from the second supply voltage to thefirst supply voltage before transitioning an operating frequency of theapparatus, a second transition of the operating frequency, from thesecond frequency to the first frequency.

In Example 12, the power management control circuit of any one or moreof Examples 1-11 optionally is configured to detect the secondtransition of the supply voltage and to provide second commandinformation to the one or more delay elements before the secondtransition of the operating frequency.

In Example 13, the apparatus of any one or more of Examples 1-12optionally s a multiple-core processor, and wherein a first core of themultiple-core processor includes the plurality of clock buffers and theone-time programmable locate critical path mechanism.

In Example 14, a method for operating a multiple-core processor caninclude enabling a delay of a clock signal of a plurality of sequentialcircuit devices of a first core of the multiple-core processor when afirst supply voltage of the plurality of sequential circuit devices isabove a threshold, operating the plurality of sequential circuit devicesof the first core in a first non-test mode using the first supplyvoltage and a first clock frequency, commanding a drop in operatingfrequency of the plurality of sequential circuit devices from the firstclock frequency to a second clock frequency using a power managementcontroller of the first core, disabling the delay of the clock signalwhen the operating frequency is below a frequency threshold, andoperating the plurality of sequential circuit devices in a secondnon-test mode using the second clock frequency, wherein the second clockfrequency is lower than the first clock frequency.

In Example 15, the disabling the delay of any one or more of Examples1-14 optionally includes disabling the delay of the clock signal whenthe operating frequency is below a frequency threshold using an outputof the power management controller.

In Example 16, the method of any one or more of Examples 1-15 optionallyincludes commanding a drop in a supply voltage of the plurality ofsequential circuits from the first supply voltage to a second supplyvoltage after the delay is disable.

In Example 17, the first supply voltage of any one or more of Examples1-16 optionally is above a voltage threshold, the voltage thresholdindicative of a minimum supply voltage configured to operate thesequential circuits with the delay enabled and without timing failureswhen the operating frequency is below the frequency threshold.

In Example 18, the disabling the delay of any one or more of Examples1-17 optionally includes interrupting a fixed command signal configuredby a locate critical path mechanism of a functional unit block of thefirst core during post-production testing of the multiple-coreprocessor.

In Example 19, after operating the plurality of sequential circuitdevices in a second non-test mode, the method of any one or more ofExamples 1-18 optionally includes commanding a rise in the supplyvoltage of the plurality of sequential circuits to a third voltage levelabove a voltage threshold, enabling the delay of the clock signal afterthe supply voltage of the plurality of sequential circuits is above thevoltage threshold, and commanding a rise in the operating frequency ofthe plurality of sequential circuits to a third clock frequency afterthe delay of the clock signal is enabled, wherein the third clockfrequency is higher than the frequency threshold.

In Example 20, the enabling and disabling the delay of the clock signalof any one or more of Examples 1-19 optionally includes enabling anddisabling a delay element of a regional clock buffer of a functionalunit block of the first core using a power management controller of themultiple-core processor.

Each of these non-limiting examples can stand on its own, or can becombined with one or more of the other examples in any permutation orcombination.

Example 21 can include, or can optionally be combined with any portionor combination of any portions of any one or more of Examples 1 through20 to include, subject matter that can include means for performing anyone or more of the functions of Examples 1 through 20, or amachine-readable medium including instructions that, when performed by amachine, cause the machine to perform any one or more of the functionsof Examples 1 through 20

The above detailed description includes references to the accompanyingdrawings, which form a part of the detailed description. The drawingsshow, by way of illustration, specific embodiments in which theinvention can be practiced. These embodiments are also referred toherein as “examples.” Such examples can include elements in addition tothose shown or described. However, the present inventors alsocontemplate examples in which only those elements shown or described areprovided. Moreover, the present inventors also contemplate examplesusing any combination or permutation of those elements shown ordescribed (or one or more aspects thereof), either with respect to aparticular example (or one or more aspects thereof), or with respect toother examples (or one or more aspects thereof) shown or describedherein.

In this document, the terms “a” or “an” are used, as is common in patentdocuments, to include one or more than one, independent of any otherinstances or usages of “at least one” or “one or more.” In thisdocument, the term “or” is used to refer to a nonexclusive or, such that“A or B” includes “A but not B.” “B but not A,” and “A and B,” unlessotherwise indicated. In this document, the terms “including” and “inwhich” are used as the plain-English equivalents of the respective terms“comprising” and “wherein.” Also, in the following claims, the terms“including” and “comprising” are open-ended, that is, a system, device,article, composition, formulation, or process that includes elements inaddition to those listed after such a term in a claim are still deemedto fall within the scope of that claim. Moreover, in the followingclaims, the terms “first,” “second,” and “third,” etc. are used merelyas labels, and are not intended to impose numerical requirements ontheir objects.

The above description is intended to be illustrative, and notrestrictive. For example, the above-described examples (or one or moreaspects thereof) may be used in combination with each other. Otherembodiments can be used, such as by one of ordinary skill in the artupon reviewing the above description. The Abstract is provided to complywith 37 C.F.R. § 1.72(b), to allow the reader to quickly ascertain thenature of the technical disclosure. It is submitted with theunderstanding that it will not be used to interpret or limit the scopeor meaning of the claims. Also, in the above Detailed Description,various features may be grouped together to streamline the disclosure.This should not be interpreted as intending that an unclaimed disclosedfeature is essential to any claim. Rather, inventive subject matter maylie in less than all features of a particular disclosed embodiment.Thus, the following claims are hereby incorporated into the DetailedDescription, with each claim standing on its own as a separateembodiment, and it is contemplated that such embodiments can be combinedwith each other in various combinations or permutations. The scope ofthe invention should be determined with reference to the appendedclaims, along with the full scope of equivalents to which such claimsare legally entitled.

What is claimed is:
 1. An apparatus comprising: a plurality of clockbuffers, each clock buffer of the plurality of clock buffers configuredto receive a first clock signal and distribute a plurality of secondclock signals; a one-time programmable locate critical path mechanismconfigured provide a plurality of indications to enable or disable afirst delay of each clock buffer of the plurality of clock buffers; anda power management control circuit configured to over-ride one or moreof the plurality of indications in a first non-test mode of operation ofthe apparatus and to not over-ride the one or more indications in asecond non-test mode of operation of the apparatus.
 2. The apparatus ofclaim 1, wherein the one-time programmable locate critical pathmechanism is programmed during a test mode of the apparatus.
 3. Theapparatus of claim 1, wherein the first non-test mode is defined by afirst supply voltage of the apparatus and a first frequency of the firstclock signal; and wherein the second non-test mode is defined by asecond supply voltage of the apparatus and a second frequency of thefirst clock signal.
 4. The apparatus of claim 3, including a pluralityof delay controller circuits, each delay control circuit configured toreceive one indication of the plurality of indications and an output ofthe power management control circuit, and to control one or more delayelements of the plurality of clock buffers based on the one indicationand the output of the power management control circuit.
 5. The apparatusof claim 4, wherein the power management control circuit is configuredto receive a representation of the supply voltage of the apparatus and arepresentation of the frequency of the first clock signal, and toprovide control information to the plurality of delay controllercircuits as the output of the power management control circuit.
 6. Theapparatus of claim 5, wherein the power management control circuitincludes a first voltage threshold and a first frequency threshold. 7.The apparatus of claim 6, wherein during a transition from the firstmode to the second mode, the apparatus is configured to transition anoperating frequency of the apparatus, a first transition of theoperating frequency, from the first frequency to the second frequencybefore transitioning a supply voltage of the apparatus, a firsttransition of the supply voltage, from the first supply voltage to thesecond supply voltage, wherein the first frequency is higher than thesecond frequency.
 8. The apparatus of claim 5, wherein the powermanagement control circuit is configured to detect the first transitionof the operating frequency, and to provide first command information tothe one or more delay elements before the first transition of the supplyvoltage.
 9. The apparatus of claim 8, wherein the one or more delayelements are configured to provide a second delay in response to thefirst command information.
 10. The apparatus of claim 9, wherein thesecond delay is equivalent to bypassing the one or more delay elements.11. The apparatus of claim 8, wherein, during a transition from thesecond mode to the first mode, the apparatus is configured to transitiona supply voltage of the apparatus, a second transition of the supplyvoltage, from the second supply voltage to the first supply voltagebefore transitioning an operating frequency of the apparatus, a secondtransition of the operating frequency, from the second frequency to thefirst frequency.
 12. The apparatus of claim 11, wherein the controlleris configured to detect the second transition of the supply voltage andto provide second command information to the one or more delay elementsbefore the second transition of the operating frequency.
 13. Theapparatus of claim 1, wherein the apparatus is a multiple-coreprocessor, and wherein a first core of the multiple-core processorincludes the plurality of clock buffers and the one-time programmablelocate critical path mechanism.
 14. A method for operating amultiple-core processor, the method comprising: enabling a delay of aclock signal of a plurality of sequential circuit devices of a firstcore of the multiple-core processor when a first supply voltage of theplurality of sequential circuit devices is above a threshold, operatingthe plurality of sequential circuit devices of the first core in a firstnon-test mode using the first supply voltage and a first clockfrequency; commanding a drop in operating frequency of the plurality ofsequential circuit devices from the first clock frequency to a secondclock frequency using a power management controller of the first core;disabling the delay of the clock signal when the operating frequency isbelow a frequency threshold; and operating the plurality of sequentialcircuit devices in a second non-test mode using the second clockfrequency, wherein the second clock frequency is lower than the firstclock frequency.
 15. The method of claim 14, wherein disabling the delayincludes disabling the delay of the clock signal when the operatingfrequency is below a frequency threshold using an output of the powermanagement controller.
 16. The method of claim 14, including commandinga drop in a supply voltage of the plurality of sequential circuits fromthe first supply voltage to a second supply voltage after the delay isdisable.
 17. The method of claim 16, wherein the first supply voltage isabove a voltage threshold, the voltage threshold indicative of a minimumsupply voltage configured to operate the sequential circuits with thedelay enabled and without timing failures when the operating frequencyis below the frequency threshold.
 18. The method of claim 14, whereindisabling the delay includes interrupting a fixed command signalconfigured by a locate critical path mechanism of a functional unitblock of the first core during post-production testing of themultiple-core processor.
 19. The method of claim 14, wherein, afteroperating the plurality of sequential circuit devices in a secondnon-test mode, the method includes: commanding a rise in the supplyvoltage of the plurality of sequential circuits to a third voltage levelabove a voltage threshold; enabling the delay of the clock signal afterthe supply voltage of the plurality of sequential circuits is above thevoltage threshold; and commanding a rise in the operating frequency ofthe plurality of sequential circuits to a third clock frequency afterthe delay of the clock signal is enabled, wherein the third clockfrequency is higher than the frequency threshold.
 20. The method ofclaim 19, wherein enabling and disabling the delay of the clock signalincludes enabling and disabling a delay element of a regional clockbuffer of a functional unit block of the first core using a powermanagement controller of the multiple-core processor.